Robust Reliability Inference for Highly Durable Interval-Censored Data; Optimal designs of multiple step-stress accelerated life tests for one-shot devices
日期:2025-06-20
时间:15:00:00
讲师:Dr. María Jaenada Malagon, Dr. Ling Man Ho Alpha
地点:D4-G/F-03
Registration: (Link)
