ASQ Reliability & Risk Division Best Reliability Paper Award 2023/24 for the paper entitled "On reliability analysis of one-shot device testing data with defects"
日期:2024-08-30
时间:23:59:00
ASQ Reliability & Risk Division Best Reliability Paper Award 2023/24 for the paper entitled "On reliability analysis of one-shot device testing data with defects".
Shang, X.W., Ng, H.K.T., Ling, M.H. On reliability analysis of one-shot device testing data with defects, Quality Engineering, 35, 79-94, 2023.
